Pham, M. and Le, V. and Le, H. and Truong, S. (2020) Invariant-ability of the PSF of wide-field microscopy to the DOF by using cubic phase mask. In: 4th International Conference on Recent Advances in Signal Processing, Telecommunications and Computing, SigTelCom 2020, 28 August 2020 through 29 August 2020.
Invariant-ability of the PSF of wide-field microscopy to the DOF by using cubic phase mask.pdf
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Abstract
In this paper, we have suggested the new technique for the improvement of the invariant ability of the point spread function (PSF) of wide-field microscopy to the depth of field (DOF). When a cubic phase mask (CPM) is inserted in the exist-pupil position of the imaging system, the invariant-ability of the point spread function (PSF) to the DOF is enhanced. The comparison for the invariant-ability of the PSFs for the traditional imaging system (IMS) and the CPM to the DOF are presented. Moreover, the experimental setup of the IMS is built. The experimental results are shown and agree with the simulation results. © 2020 IEEE.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Divisions: | Faculties > Faculty of Special Equipments Faculties > Faculty of Radio-Electronic Engineering |
| Identification Number: | 10.1109/SigTelCom49868.2020.9199048 |
| Uncontrolled Keywords: | Imaging systems; Cubic phase mask; Depth of field; Wide-field microscopies; Optical transfer function |
| Additional Information: | Conference code: 163167. Language of original document: English. |
| URI: | http://eprints.lqdtu.edu.vn/id/eprint/8962 |
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