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Article

Khuat, V. and Dutertre, J.-M. and Danger, J.-L. (2024) Software countermeasures against the multiple instructions skip fault model. Microelectronics Reliability, 155.

Conference or Workshop Item

Khuat, V. and Trabelsi, O. and Sauvage, L. and Danger, J.-L. (2021) Multiple and Reproducible Fault Models on Micro-controller using Electromagnetic Fault Injection. In: 2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, EMC/SI/PI/EMC Europe 2021, 26 July 2021 through 20 August 2021.