Browse by Author
Number of items: 1.
Journals peer-reviewed by Scopus
An, D.K. and Tuan, P.A. and Dung, V.B. and Truong, N.V.
(2006)
On the atomistic dynamic modelling of simultaneous diffusion of dopant and point defect (B, V, I) in silicon material.
In: UNSPECIFIED.
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