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Journals peer-reviewed by Scopus

Phan, N.N. and Le, H.H. and Duong, D.C. and Ta, D.V. (2019) Measurement of nanoscale displacements using a Mirau white-light interference microscope and an inclined flat surface. Optical Engineering, 58 (6): 64106. ISSN 913286

Phan, N.N. and Le, H.H. and Duong, D.C. (2019) Surface curvature measurement of microlenses using a white-light interference microscope and fast geometric fit algorithm. Optical Engineering, 58 (12): 124105. ISSN 913286