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2020

Vintr, Z. and Cu, X.P. and Tran, C.V. (2020) Evaluation of electronic components degradation using the accelerated reliability testing data. In: 30th European Safety and Reliability Conference, ESREL 2020 and 15th Probabilistic Safety Assessment and Management Conference, PSAM 2020, 1 November 2020 through 5 November 2020.