Mai, Huy V. and Jaffré, Alexandre and Doan, Khai M. and Trinh, Thien D. and Schneegans, Olivier (2022) A New Simple Analytical Method for a Highly Accurate Determination of the Optical Parameters of a Slab from Transmittance Data. Applied Spectroscopy. 000370282110680. ISSN 0003-7028
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To date, determining with high accuracy the optical parameters (extinction coefficient k and refractive index n) of a slab from the sole transmittance data requires an inverse method based on numerical iteration procedures. In this paper, we propose a new inverse analytical method of extracting (k, n) without numerical iterative processes. The high accuracy of this new inverse method is assessed, and as an application example, the optical parameters of CaF2 and Si substrates are determined in the IR spectral range of 4–8 µm. © The Author(s) 2022.
Item Type: | Article |
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Divisions: | Faculties > Faculty of Special Equipments |
Identification Number: | 10.1177/00037028211068078 |
Uncontrolled Keywords: | Calcium fluoride; Refractive index; Silicon, Analytical method; Extinction coefficient (k); Extinction coefficients; High-accuracy; Highly accurate; Index n; Inverse methods; Optical parameter; Simple++; Transmittance, Fluorspar |
URI: | http://eprints.lqdtu.edu.vn/id/eprint/10334 |