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Impact of Hardware Impairments on the Outage Probability and Ergodic Capacity of One-Way and Two-Way Full-Duplex Relaying Systems

Nguyen, B.C. and Tran, X.N. and Tran, D.T. and Pham, X.N. and Dung, L.T. (2020) Impact of Hardware Impairments on the Outage Probability and Ergodic Capacity of One-Way and Two-Way Full-Duplex Relaying Systems. IEEE Transactions on Vehicular Technology, 69 (8): 9099105. pp. 8555-8567. ISSN 189545

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Abstract

Hardware impairments (HI) always exist in wireless devices, especially the low-cost ones. However, due to the complicated mathematical analysis, previous studies on wireless networks usually neglected the HI, particularly for full-duplex relaying (FDR) systems. In this paper, we consider the impact of the HI on the outage probabilities (OPs) and ergodic capacities (ECs) of both one-way (OW) and two-way (TW) amplify-And-forward (AF) FDR systems. We also take into account the residual self-interference (RSI) due to the imperfect self-interference cancellation (SIC), which appears at the FDR node of the considered HI-OW-AF-FDR system and all nodes of the considered HI-TW-AF-FDR system. Particularly, we derive the exact expressions of the outage probabilities and ergodic capacities for the HI-OW-AF-FDR and HI-TW-AF-FDR systems using mathematical analysis. Numerical results show that the OPs and ECs of the two systems are significantly affected by both HI and RSI, however the impact of the HI is more serious. It is recommended that besides SIC techniques, effective methods to reduce the HI should also be used to guarantee the system performance. © 1967-2012 IEEE.

Item Type: Article
Divisions: Faculties > Faculty of Radio-Electronic Engineering
Identification Number: 10.1109/TVT.2020.2996618
Uncontrolled Keywords: Probability; Amplify-and-forward; Ergodic capacity; Full-duplex relaying; Mathematical analysis; Numerical results; Outage probability; Self-interferences; Wireless devices; Channel capacity
Additional Information: Language of original document: English.
URI: http://eprints.lqdtu.edu.vn/id/eprint/8964

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