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Strain effects on the electronic and optical properties of Van der Waals heterostructure MoS2/WS2: A first-principles study

Farkous, M. and Bikerouin, M. and Thuan, D.V. and Benhouria, Y. and El-Yadri, M. and Feddi, E. and Erguig, H. and Dujardin, F. and Nguyen, C.V. and Hieu, N.V. and Bui, H.D. and Hieu, N.N. and Phuc, H.V. (2020) Strain effects on the electronic and optical properties of Van der Waals heterostructure MoS2/WS2: A first-principles study. Physica E: Low-Dimensional Systems and Nanostructures, 116: 113799. ISSN 13869477

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Abstract

In the present work, the effect of biaxial and uniaxial strains on the electronic and optical properties of heterostructure MoS2/WS2 has been studied by density functional theory. Our numerical calculations demonstrate that the heterostructure MoS2/WS2 is an indirect semiconductor with a type-II band alignment and its energy gap is 1.45 eV. Besides, the semiconductor–metal transition can be found at large biaxial strain of 14% in the van der Waals heterostructure MoS2/WS2. Influence of the strain engineering on the optical spectra of the heterostructure MoS2/WS2 are also considered in this work. Our calculations indicate that, while the effect of uniaxial strain on the optical properties is quite weak, the optical parameters of the heterostructure MoS2/WS2 depend strongly on the biaxial strain. Our predicted results may be a reference for future experimental and theoretical studies of the heterostructures. © 2019 Elsevier B.V.

Item Type: Article
Divisions: Faculties > Faculty of Mechanical Engineering
Identification Number: 10.1016/j.physe.2019.113799
Uncontrolled Keywords: Calculations; Density functional theory; Heterojunctions; Layered semiconductors; Molybdenum compounds; Strain; Van der Waals forces; DFT calculation; Electronic and optical properties; First-principles study; Indirect semiconductor; Numerical calculation; Strain engineering; Type II band alignments; Van der waals; Optical properties
Additional Information: Language of original document: English.
URI: http://eprints.lqdtu.edu.vn/id/eprint/9072

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