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Evaluation of electronic components degradation using the accelerated reliability testing data

Vintr, Z. and Cu, X.P. and Tran, C.V. (2020) Evaluation of electronic components degradation using the accelerated reliability testing data. In: 30th European Safety and Reliability Conference, ESREL 2020 and 15th Probabilistic Safety Assessment and Management Conference, PSAM 2020, 1 November 2020 through 5 November 2020.

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Abstract

The accelerated reliability testing is a useful tool to quickly obtain information about reliability of products. ART are widely used in the automotive and electrotechnical industries to estimate or verify the reliability parameters of component and system, to improve product reliability through detection of potential defects, to evaluate and compare products of different manufacturers. During the technical life, the majority of electronic component show degradation characteristics (degradation of individual technical parameters). This article describes the methodology how to evaluate reliability of electronic components in combat vehicles through degradation analysis of accelerated reliability testing data. In degradation analysis, basic mathematical models are used to extrapolate the performance measurements over time to the point where the product would have degraded beyond a limit value. When the degradation parameter exceeds a limit value, it can be considered a failure because test unit will be useless after those degradation levels. The paper demonstrate a practical application of the proposed method in the case of light emitting diodes, where process of degradation consists in degradation of light intensity. Copyright © ESREL2020-PSAM15 Organizers.Published by Research Publishing, Singapore.

Item Type: Conference or Workshop Item (Paper)
Divisions: Faculties > Faculty of Vehicle and Energy Engineering
Uncontrolled Keywords: Automobile manufacture; Military vehicles; Network components; Safety engineering; Degradation analysis; Degradation characteristics; Degradation parameter; Electro-technical industry; Electronic component; Performance measurements; Reliability parameters; Reliability testing; Reliability analysis
Additional Information: Conference code: 169730. Language of original document: English.
URI: http://eprints.lqdtu.edu.vn/id/eprint/9082

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