Pham, K.D. and Vi, V.T.T. and Thuan, D.V. and Phuong, L.T.T. and Hoa, L.T. and Hieu, N.V. and Nguyen, C.V. and Phuc, H.V. and Jappor, H.R. and Cuong, N.Q. and Hoi, B.D. and Hieu, N.N. (2019) Tunable electronic properties of InSe by biaxial strain: From bulk to single-layer. Materials Research Express, 6 (11): 115002. ISSN 20531591
Tunable electronic properties of InSe by biaxial strainFrom bulk to single-layer.pdf
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Abstract
In the present work, we consider the electronic properties of bulk and single-layer InSe using the density functional theory. Our calculations show that at the equilibrium state, the single-layer InSe is a semiconductor with an indirect energy bandgap of 1.382 1 eV, nearly twice the bandgap of bulk InSe. Focusing on the effect of biaxial strain ϵ bon electronic properties of single-layer InSe, our calculated results indicate that tensile biaxial strain changes slightly the valence subbands near Fermi level, while the band structure of the single-layer InSe depends tightly on the compressive biaxial strain. Also, the energy gap of the single-layer InSe depends almost linearly on the ϵ b. However, the energy gap tends to increase slowly when the large compressive biaxial strain is applied. We believe that the control of the energy gap of the single-layer InSe by strain engineering can be useful in its application in nanoelectromechanical systems and nanoelectronic devices. © 2019 IOP Publishing Ltd.
Item Type: | Article |
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Divisions: | Faculties > Faculty of Mechanical Engineering |
Identification Number: | 10.1088/2053-1591/ab43ea |
Uncontrolled Keywords: | Calculations; Density functional theory; Electronic properties; Energy gap; Selenium compounds; Semiconducting selenium compounds; Equilibrium state; First-principles calculation; ITS applications; Nanoelectronic devices; Single layer; Strain engineering; Tensile biaxial strain; Tunable electronic properties; Semiconducting indium compounds |
Additional Information: | Language of original document: English. |
URI: | http://eprints.lqdtu.edu.vn/id/eprint/9262 |