Pham, K.D. and Nguyen, C.V. and Phuc, H.V. and Vu, T.V. and Hieu, N.V. and Hoi, B.D. and Nhan, L.C. and Nha, V.Q. and Hieu, N.N. (2018) Ab-initio study of electronic and optical properties of biaxially deformed single-layer GeS. Superlattices and Microstructures, 120. pp. 501-507. ISSN 7496036
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Abstract
In the present work, using density functional theory (DFT), we investigate the influence of biaxial strain εb on electronic and optical properties of single-layer GeS. Our DFT calculations show that single-layer GeS is a semiconducting material at equilibrium and semiconductor-metal phase transition may occur at large compression biaxial strain. The optical absorption of single-layer GeS is high in the range of the middle ultraviolet lights. Besides, the biaxial has a great impact on the optical spectra of single-layer GeS in the high energy domains. The semiconductor-metal phase transition and the computational results of the absorption of GeS can provide more useful information for applications in nanoelectromechanical and optoelectronic devices. © 2018 Elsevier Ltd
Item Type: | Article |
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Divisions: | Faculties > Faculty of Mechanical Engineering |
Identification Number: | 10.1016/j.spmi.2018.06.013 |
Uncontrolled Keywords: | Band structure; Calculations; Computation theory; Density functional theory; Germanium compounds; Light absorption; Optical properties; Optoelectronic devices; Semiconductor devices; Ab initio study; Computational results; Electronic and optical properties; Nano-electromechanical; Optical spectra; Semiconducting materials; Semiconductor-metal phase transition; Ultra-violet light; Semiconducting germanium compounds |
Additional Information: | Language of original document: English. |
URI: | http://eprints.lqdtu.edu.vn/id/eprint/9544 |