LE QUY DON
Technical University
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Journals peer-reviewed by Scopus

Borovik, A. and Kuleshov, A. and Trung, T.T. (2016) Verification of device model parameters for nanoscale MOSFETs. In: 8th International Conference on Advanced Technologies for Communications, ATC 2015, 14 October 2015 through 16 October 2015. Fulltext available

This list was generated on Wed Jul 3 16:29:34 2024 +07.