LE QUY DON
Technical University
VietnameseClear Cookie - decide language by browser settings

Browse by Author

[up] Up a level
Group by: Type of journals | Item Type | No Grouping
Jump to: Journals peer-reviewed by Scopus
Number of items: 1.

Journals peer-reviewed by Scopus

Borovik, A. and Kuleshov, A. and Trung, T.T. (2016) Verification of device model parameters for nanoscale MOSFETs. In: 8th International Conference on Advanced Technologies for Communications, ATC 2015, 14 October 2015 through 16 October 2015. Fulltext available

This list was generated on Fri Nov 22 10:53:54 2024 +07.