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Ha, D.D. and Trung, T.T. and Quang, N.T. and Lovshenko, I. and Khanko, V. and Stempitsky, V. (2019) Simulation of the Heavy Charged Particle Impacts on Electrical Characteristics of N-MOSFET Device Structure. In: 12th International Conference on Advanced Technologies for Communications, ATC 2019, 17 October 2019 through 19 October 2019. Fulltext available

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