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Pham, M. and Le, V. and Le, H. and Truong, S. (2020) Invariant-ability of the PSF of wide-field microscopy to the DOF by using cubic phase mask. In: 4th International Conference on Recent Advances in Signal Processing, Telecommunications and Computing, SigTelCom 2020, 28 August 2020 through 29 August 2020.